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市场调查报告书
商品编码
1938932
原子力显微镜市场-全球产业规模、份额、趋势、机会及预测(依产品、等级、应用、地区及竞争格局划分,2021-2031年)Atomic Force Microscopy, Market - Global Industry Size, Share, Trends, Opportunity, and Forecast, Segmented By Offering, By Grade, By Application, By Region & Competition, 2021-2031F |
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全球原子力显微镜 (AFM) 市场预计将从 2025 年的 5.0225 亿美元成长到 2031 年的 7.0722 亿美元,复合年增长率达到 5.87%。
原子力显微镜 (AFM) 采用高解析度扫描探测器法,利用尖锐的悬臂梁来表征奈米尺度的表面形貌和物理性质。市场成长的主要驱动力是半导体元件的持续小型化和奈米技术研究经费的增加,这两者都需要精密计量来进行缺陷分析和品质保证。这种工业需求十分显着;根据 SEMI 的一份报告,预计到 2024 年,全球半导体製造设备销售额将达到创纪录的 1130 亿美元,这凸显了强劲的资本投资环境,为检测系统的应用提供了有力支撑。
| 市场概览 | |
|---|---|
| 预测期 | 2027-2031 |
| 市场规模:2025年 | 5.0225亿美元 |
| 市场规模:2031年 | 7.0722亿美元 |
| 复合年增长率:2026-2031年 | 5.87% |
| 成长最快的细分市场 | 软体 |
| 最大的市场 | 亚太地区 |
儘管取得了这样的发展,但与光学显微镜相比,原子力显微镜在扫描速度方面仍面临显着挑战。缓慢的扫描过程限制了样品吞吐量,使得原子力显微镜难以应用于对循环时间要求极高的大规模生产环境。因此,这瓶颈通常限制了原子力显微镜的应用,使其只能用于离线实验室测试,而无法用于即时在线连续生产监控。
对半导体晶圆检测和故障分析日益增长的需求是推动全球原子力显微镜 (AFM) 市场发展的主要因素。随着製造节点尺寸的缩小,製造商越来越依赖 AFM 出色的垂直解析度来识别肉眼不可见的缺陷并测量光学技术无法测量的关键尺寸。产业庞大的生产规模进一步加剧了这种依赖性,因为在高价值製造中,精确的计量对于产量比率管理至关重要。根据半导体产业协会 (SIA) 2025 年 2 月发布的报告,预计 2024 年全球半导体销售额将达到创纪录的 6,276 亿美元,这表明大规模的工业活动需要先进的检测工具。因此,晶圆厂正在越来越多地部署自动化 AFM 系统,以在不断扩大的生产线上维持品管。
同时,在持续的公共资金支持下,奈米技术和奈米材料研究为市场扩张奠定了坚实的基础。原子力显微镜(AFM)是原子级材料表征的黄金标准,对于研究新型复合材料和生物样品至关重要。旨在促进科学领先地位的联邦津贴进一步强化了这个研究环境。根据国家奈米技术协调办公室2024年12月发布的报告,总统2025财年预算提案要求为国家奈米技术倡议拨款超过22亿美元。这笔稳定的资金使学术机构和政府实验室能够购买先进设备,直接为主要市场参与者创造收入。布鲁克公司在2025年发布的报告也印证了这一趋势,报告称其旗下包含原子力显微镜业务的BSI NANO部门在2024财年的销售额将达到11亿美元。
全球原子力显微镜 (AFM) 市场向大规模生产领域扩张的一大障碍是其固有的扫描速度限制。与几乎瞬时获取表面数据的光学检测系统不同,AFM 依赖机械过程,即物理探针在样品表面移动,这显着延长了数据采集时间。这一根本性限製造成了巨大的吞吐量差距,使得标准 AFM 设备不适用于即时在线连续晶圆检测,而快速的循环时间是晶圆检测的关键性能要求。
由于现代半导体製造规模庞大,无法跟上生产线速度直接阻碍了市场成长。该产业的运作要求快速计量解决方案能够在不影响产量比率。根据SEMI统计,2024年第二季全球晶圆製造产能达到每季4,050万片。鑑于如此庞大的运作需求,製造商无法承受原子力显微镜(AFM)用于常规检测所带来的延迟。因此,AFM目前主要局限于离线故障分析和研发工作,这使得供应商无法获得用于高速在线连续製程控制设备的大规模资金。
全自动扫描工作流程的进步正在改变市场格局,消除了原子力显微镜(AFM)以往陡峭的学习曲线。过去,取得高品质的奈米级资料需要专业操作员手动调整复杂的回馈设置,而现代系统则利用智慧演算法自主处理探针与样品之间的接触控制和扫描最佳化。这种向使用者友善设计的转变,使得AFM的应用范围扩展到非表面科学领域的专业人士,无需专门培训即可将其用于常规测量,从而拓展了AFM的应用领域。这种易用性的提升带来了显着的财务回报:2025年2月,Park Systems公布了2024财年的年销售额为1750亿韩元。这一数字主要得益于该公司自动化计量解决方案在工业和学术领域的日益普及。
同时,随着研究人员寻求仅凭形貌资讯无法获得的全面材料信息,对关联分析和多模态平台的需求日益增长。透过将原子力显微镜 (AFM) 与拉曼光谱或扫描电子显微镜等互补技术相结合,这些混合系统能够同时从同一奈米尺度区域收集物理、化学和结构数据。这种协同作用在复杂异质材料的分析中尤其重要,因为精确表征需要将结构细节与化学成分关联起来。对这种多方面分析的需求正在推动该领域的快速成长。 2024 年 6 月,牛津仪器公司在 2024 年年度报告中宣布,其材料与表征部门的收入达到 2.522 亿英镑,同比增长 11.4%,这主要得益于其先进显微镜产品组合(包括关联原子力显微镜和拉曼系统)的强劲销售。
The Global Atomic Force Microscopy (AFM) Market is projected to expand from USD 502.25 Million in 2025 to USD 707.22 Million by 2031, achieving a CAGR of 5.87%. AFM employs a high-resolution scanning probe method that uses a sharp-tipped cantilever to assess surface topography and physical characteristics at the nanoscale. Market growth is primarily driven by the ongoing miniaturization of semiconductor components and elevated funding for nanotechnology research, both of which demand precise metrology for defect analysis and quality assurance. This industrial need is substantial; SEMI reported that in 2024, global sales of total semiconductor manufacturing equipment were expected to hit a record $113 billion, highlighting the strong capital expenditure climate that supports the acquisition of inspection systems.
| Market Overview | |
|---|---|
| Forecast Period | 2027-2031 |
| Market Size 2025 | USD 502.25 Million |
| Market Size 2031 | USD 707.22 Million |
| CAGR 2026-2031 | 5.87% |
| Fastest Growing Segment | Software |
| Largest Market | Asia Pacific |
Despite this growth, the technology faces a major obstacle regarding scanning speed relative to optical microscopy. The slow nature of the scanning process constrains sample throughput, making it difficult to incorporate AFM into high-volume manufacturing environments where fast cycle times are critical. As a result, this bottleneck frequently restricts the technology to offline laboratory examinations rather than real-time, inline production monitoring.
Market Driver
The escalating demand for semiconductor wafer inspection and failure analysis serves as the primary catalyst driving the Global Atomic Force Microscopy (AFM) Market. As fabrication nodes decrease in size, manufacturers depend more on AFM's exceptional vertical resolution to identify non-visual defects and measure critical dimensions that optical techniques cannot resolve. This dependency is amplified by the industry's vast production scale, where accurate metrology is vital for yield management in high-value manufacturing. According to the Semiconductor Industry Association in February 2025, global semiconductor sales attained a record $627.6 billion in 2024, demonstrating the massive industrial activity requiring advanced inspection tools. Consequently, fabrication plants are adopting automated AFM systems to maintain quality control across their growing production lines.
Concurrently, the growth of nanotechnology and nanomaterials research serves as a strong basis for market expansion, supported by continued public funding. AFM is the standard instrument for characterizing material properties at the atomic scale, crucial for studying new composites and biological specimens. This research environment is bolstered by federal grants designed to promote scientific leadership; the National Nanotechnology Coordination Office reported in December 2024 that the President's 2025 Budget requested over $2.2 billion for the National Nanotechnology Initiative. This steady funding enables academic and government labs to purchase advanced equipment, directly generating revenue for major market players. Highlighting this trend, Bruker Corporation reported in 2025 that its BSI NANO segment, which includes its AFM business, achieved fiscal year 2024 revenue of $1.10 billion.
Market Challenge
A critical bottleneck preventing the Global Atomic Force Microscopy (AFM) Market from entering the high-volume manufacturing sector is the inherent limitation in scanning speed. In contrast to optical inspection systems that acquire surface data nearly instantly, AFM depends on a physical probe moving across the sample, a mechanical method that greatly prolongs data collection time. This fundamental restriction causes a significant throughput gap, making standard AFM setups inappropriate for real-time, inline wafer inspection where fast cycle times are a key performance requirement.
This inability to keep pace with production line speeds directly hinders market growth due to the vast scale of modern semiconductor fabrication. The industry operates at volumes necessitating rapid metrology solutions to sustain yield without impeding output. According to SEMI, global installed wafer fab capacity reached 40.5 million wafers per quarter during the second quarter of 2024. Given such immense throughput demands, manufacturers cannot accept the latency associated with atomic force microscopy for general inspection. As a result, AFM remains primarily limited to offline failure analysis and R&D tasks, preventing vendors from accessing the significantly larger capital budgets designated for high-speed, inline process control machinery.
Market Trends
The progression of fully automated scanning workflows is transforming the market by removing the steep learning curve once required for atomic force microscopy. While obtaining high-quality nanoscale data previously demanded expert operators to manually tune complex feedback settings, modern systems now utilize intelligent algorithms to autonomously handle tip-sample engagement and scan optimization. This transition toward user-friendly design enables various industries to use AFM for routine measurements without specialized training, expanding access beyond dedicated surface scientists. This operational shift is driving significant financial results; Park Systems reported in February 2025 that its annual sales revenue reached 175 billion KRW in 2024, a figure attributed to the growing adoption of its automated metrology solutions in both industrial and academic fields.
At the same time, the rise of correlative and multi-modal platforms is increasing as researchers demand comprehensive material insights that topography alone cannot supply. By combining AFM with complementary methods like Raman spectroscopy or scanning electron microscopy, these hybrid systems permit the simultaneous collection of physical, chemical, and structural data from the same nanoscale area. This synergy is especially vital for analyzing complex heterogeneous materials where linking structural details with chemical composition is necessary for precise characterization. The need for such multifaceted analysis is actively fueling segment growth; Oxford Instruments stated in June 2024 that its Materials & Characterisation segment achieved revenue of £252.2 million in its 2024 annual report, representing an 11.4% rise driven by strong sales of its advanced microscopy portfolio, including correlative AFM and Raman systems.
Report Scope
In this report, the Global Atomic Force Microscopy (AFM) Market has been segmented into the following categories, in addition to the industry trends which have also been detailed below:
Company Profiles: Detailed analysis of the major companies present in the Global Atomic Force Microscopy (AFM) Market.
Global Atomic Force Microscopy (AFM) Market report with the given market data, TechSci Research offers customizations according to a company's specific needs. The following customization options are available for the report: