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市场调查报告书
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1874665

全球故障分析市场

Failure Analysis
出版日期: | 出版商: Market Glass, Inc. (Formerly Global Industry Analysts, Inc.) | 英文 197 Pages | 商品交期: 最快1-2个工作天内

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简介目录

全球故障分析市场预计2030年将达到98亿美元

全球失效分析市场规模预计在2024年达到65亿美元，到2030年将达到98亿美元，在分析期间（2024-2030年）内复合年增长率（CAGR）为6.9%。本报告分析的细分市场之一－电子和半导体应用领域，预计将以7.5%的复合年增长率成长，并在分析期结束时达到44亿美元。材料科学应用领域预计在分析期间将以6.1%的复合年增长率成长。

美国市场规模估计为18亿美元，而中国市场预计将以6.4%的复合年增长率成长。

预计2024年，美国故障分析市场规模将达18亿美元。作为世界第二大经济体，中国预计到2030年市场规模将达到15亿美元，在2024年至2030年的分析期间内，复合年增长率（CAGR）为6.4%。其他值得关注的区域市场包括日本和加拿大，预计在分析期内，它们的复合年增长率分别为6.7%和5.6%。在欧洲，德国预计将以约5.8%的复合年增长率成长。

全球故障分析市场—主要市场趋势与驱动因素概述

故障分析如何改变工程和产品开发？

失效分析透过深入剖析组件、系统处理的原因和机制，正在改变工业界的工程和产品开发方法。这种多学科交叉的实践方法旨在探讨材料、电子元件、结构和机器失效的根本原因，以防止未来再次发生失效，提高安全性，并改进产品设计。借助扫描电子显微镜 (SEM)、X射线衍射和机械应力测试等先进技术，工程师和科学家可以识别导致产品或系统失效的根本因素（例如机械、热、化学和电气因素）。

在航太、汽车、电子和建筑等行业，失效分析对于确保产品和结构的可靠性和安全性至关重要。例如，关键航太零件的失效可能造成灾难性后果，因此了解失效机制对于防止故障再次发生至关重要。从失效分析中获得的洞见不仅有助于解决当前面临的问题，而且在改进产品设计、材料选择和製造流程方面也发挥关键作用。在产品生命週期的早期阶段识别缺陷，能够帮助企业加强品管、提升产品性能并减少代价高昂的召回和维修，这使得失效分析成为现代工程中不可或缺的工具。

为什么故障分析对于提高产品可靠性和防止灾难性故障至关重要？

失效分析对于提高产品可靠性和预防灾难性故障至关重要，因为它提供了一种系统化的方法来了解失效的根本原因，从而使工程师能够开发出更耐用、更可靠的设计。在航太、汽车和核能等安全关键型产业，一次失效可能导致重大的经济损失、环境破坏，甚至人员伤亡。失效分析能够识别确切的失效模式——疲劳、腐蚀、热劣化、应力断裂等等——并提供解决方案，以防止未来发生类似事件。透过调查材料缺陷、设计问题、使用不当和製造偏差等因素，失效分析可以防止问题再次发生，并确保产品的长期性能和安全性。

此外，失效分析能够帮助製造商改进材料和製造工艺，从而提高产品可靠性。例如，在电子产品製造中，失效分析可以揭示某些元件因热应力、电过应力或焊接製程不当而失效的原因。识别这些问题后，製造商可以调整设计参数、选择更合适的材料或改进组装工艺，从而提高产品可靠性。因此，失效分析是一种积极主动的策略，能够帮助企业避免代价高昂的产品召回、减少保固索赔，并透过持续提供高品质、可靠的产品来建立消费者信任。它还在风险管理中发挥关键作用，帮助各行业遵守监管标准和安全认证，并最大限度地降低意外事故和故障的可能性。

失效分析在各产业有哪些不断扩展与创新的应用？

随着技术和材料科学的不断进步，失效分析的应用范围正扩展到许多行业。在航太和国防领域，失效分析被广泛用于研究发动机、起落架和航空电子系统等关键部件的失效。飞机部件暴露在恶劣的环境中，即使是最小的失效也可能造成重大的安全隐患。航太领域的失效分析通常采用断裂分析、金相分析和无损检测 (NDT) 等技术，以检测可能损害零件完整性的断裂、疲劳和腐蚀。此外，失效分析在理解太空船零件的材料疲劳方面也发挥关键作用，有助于开发更安全、更可靠的太空探勘技术。

在汽车行业，故障分析对于确保车辆的安全性和耐久性至关重要，尤其是在电动车 (EV) 和自动驾驶技术日益普及的今天。工程师利用故障分析来调查电池劣化、马达故障和感测器失灵等问题。由于电动车电池会经历热循环和反覆的充放电循环，故障分析可以识别电池劣化的原因，并提案改进材料和冷却系统的建议，从而延长电池寿命。此外，随着自动驾驶技术的兴起，故障分析越来越多地被用于确保感测器、处理器和其他电子元件在实际环境中可靠运行，从而提高车辆的安全性和性能。

失效分析领域的创新正在推动更先进的工具和技术的发展，用于调查和预测失效。例如，扫描电子显微镜 (SEM) 和穿透式电子显微镜(TEM) 的进步使工程师能够在原子尺度上分析材料，并识别可能导致失效的缺陷或微观结构变化。这种精度在半导体和奈米技术等行业尤其重要，因为即使是最小的缺陷也可能导致灾难性的产品失效。此外，人工智慧 (AI) 和机器学习正被整合到失效分析过程中，从而能够快速识别大型资料集中的失效模式。 AI 演算法可以侦测不同变数（例如温度、应力和材料特性）之间的细微关联，从而更深入地了解失效原因，并实现更准确的失效预测。

在能源领域，故障分析对于维护发电设备（包括涡轮机、发电机和输电线路）的安全性和可靠性至关重要。随着全球能源需求的持续成长，风力发电机和太阳能板等可再生能源系统日益普及，故障分析有助于识别这些系统中机械磨损、腐蚀和电气故障的根本原因。例如，在风力发电机中，故障分析用于了解叶片疲劳、齿轮箱故障和发电机损坏等问题，有助于延长设备寿命并提高整体能源效率。随着对永续能源的依赖性不断增强，故障分析在确保可再生能源基础设施长期可靠性方面的作用比以往任何时候都更加重要。

哪些因素正在推动故障分析市场的成长？

故障分析市场的成长受多种关键因素驱动，包括现代技术的日益复杂化、对产品可靠性和安全性的不断增长的需求，以及分析工具和技术的进步。其中一个关键驱动因素是电子、航太、汽车和能源等产业产品和系统的日益复杂化。随着设备变得更加精密，采用先进材料、微型化组件和复杂设计，设计缺陷、材料缺陷和製造错误导致的故障机率也随之增加。故障分析对于诊断这些问题至关重要，并能帮助製造商在竞争日益激烈的市场中维持产品品质和可靠性。

推动故障分析市场成长的另一个关键因素是人们对安全性的日益重视，尤其是在航太、医疗和汽车等受监管行业。世界各国政府和监管机构都制定了严格的安全标准和认证，企业必须满足这些标准和认证要求，以确保其产品和流程的安全性和可靠性。故障分析透过识别潜在的安全隐患并预防可能导致事故、产品召回和监管处罚的故障，帮助企业遵守这些标准。例如，在汽车产业，煞车、安全气囊和电池等关键零件必须符合严格的安全标准，而故障分析是检验这些零件在实际工况下是否正常运作的重要手段。

高科技产业（例如半导体製造、通讯和可再生能源）对可靠性的需求日益增长，也推动了故障分析的发展。随着全球经济对先进技术的依赖程度越来越高，企业无法承受可能导致业务中断和经济损失的系统故障。故障分析在半导体产业中扮演着至关重要的角色，因为即使是积体电路中最微小的缺陷也可能导致严重的效能问题。此外，随着5G网路和物联网(IoT)的扩展，确保电子元件和系统的可靠性比以往任何时候都更加重要。故障分析有助于在製造过程早期发现潜在的漏洞，从而确保产品符合这些高科技行业严格的性能要求。

无损检测 (NDT)、扫描电子显微镜 (SEM) 和 X 光断层扫描等分析工具和技术的进步也进一步推动了失效分析市场的成长。这些工具使工程师能够以前所未有的精度检测材料和零件，从而识别肉眼无法看到的缺陷、裂缝和其他磨损和损伤征兆。人工智慧 (AI) 和机器学习在失效分析流程中的应用提高了预测失效和优化维护计划的能力，进一步推动了对可靠性和性能要求高的行业对失效分析的采用。

总之，随着各产业对产品可靠性、安全性和性能的要求不断提高，故障分析市场预计将迎来显着成长。随着技术日益复杂，故障预防的重要性日益凸显，故障分析将在确保各行业产品和系统的长期成功方面发挥越来越重要的作用。随着分析技术的不断进步和人工智慧的整合，故障分析将持续发展，为企业提供强大的工具，以加强品管、提升安全性并优化产品开发。

部分：

设备（扫描电子显微镜（SEM）、聚焦离子束设备（FIB）、双光束分光光谱仪（FIB-SEM）、穿透式电子显微镜（TEM）、其他设备）应用（电子/半导体、材料科学、工业科学、生物科学）

受访公司范例

  • A&D Company Ltd.
  • Carl Zeiss Smt GmbH
  • FEI Company
  • Hitachi High-Technologies Corporation
  • Intertek Group PLC
  • JEOL Ltd.
  • Motion X Corporation
  • Tescan Orsay Holding, as
  • Thermo Fisher Scientific, Inc.

人工智慧集成

我们正在利用检验的专家内容和人工智慧工具，改变您分析市场和竞争情报的方式。

Global Industry Analysts 并没有依赖通用的 LLM 或查询产业专用的SLM，而是建立了一个由世界各地领域专家精心整理的内容库，包括视讯转录、部落格、搜寻引擎研究以及大量的公司、产品/服务和市场数据。

关税影响係数

我们最新发布的报告纳入了关税对区域市场的影响，正如全球产业分析师预测的那样，关税将改变企业的竞争地位，而企业的竞争地位将取决于其总部所在地、製造地以及进出口（成品和OEM产品）。这种复杂多变的市场现实将透过微观和宏观市场动态影响竞争对手，包括销货成本增加、盈利下降以及供应链重组。

目录

第一章调查方法

第二章执行摘要

  • 市场概览
  • 主要企业
  • 市场趋势和驱动因素
  • 全球市场展望

第三章 市场分析

  • 美国
  • 加拿大
  • 日本
  • 中国
  • 欧洲
  • 法国
  • 德国
  • 义大利
  • 英国
  • 其他欧洲
  • 亚太地区
  • 世界其他地区

第四章 竞赛

简介目录
Product Code: MCP11908

Global Failure Analysis Market to Reach US$9.8 Billion by 2030

The global market for Failure Analysis estimated at US$6.5 Billion in the year 2024, is expected to reach US$9.8 Billion by 2030, growing at a CAGR of 6.9% over the analysis period 2024-2030. Electronics & Semiconductor Application, one of the segments analyzed in the report, is expected to record a 7.5% CAGR and reach US$4.4 Billion by the end of the analysis period. Growth in the Material Science Application segment is estimated at 6.1% CAGR over the analysis period.

The U.S. Market is Estimated at US$1.8 Billion While China is Forecast to Grow at 6.4% CAGR

The Failure Analysis market in the U.S. is estimated at US$1.8 Billion in the year 2024. China, the world's second largest economy, is forecast to reach a projected market size of US$1.5 Billion by the year 2030 trailing a CAGR of 6.4% over the analysis period 2024-2030. Among the other noteworthy geographic markets are Japan and Canada, each forecast to grow at a CAGR of 6.7% and 5.6% respectively over the analysis period. Within Europe, Germany is forecast to grow at approximately 5.8% CAGR.

Global Failure Analysis Market - Key Trends and Drivers Summarized

How Is Failure Analysis Revolutionizing Engineering and Product Development?

Failure analysis is transforming the way industries approach engineering and product development by providing in-depth insights into why and how components, systems, or processes fail. This interdisciplinary practice involves investigating the root causes of failures in materials, electronics, structures, and machinery to prevent future occurrences, improve safety, and enhance product design. By using advanced techniques such as scanning electron microscopy (SEM), X-ray diffraction, and mechanical stress testing, engineers and scientists can identify the underlying factors-whether mechanical, thermal, chemical, or electrical-that led to a product’s or system’s failure.

In industries like aerospace, automotive, electronics, and construction, failure analysis is essential for ensuring the reliability and safety of products and structures. For example, a failure in a critical aerospace component could have catastrophic consequences, making it vital to understand the failure mechanism to prevent recurrences. The insights gained from failure analysis not only help to fix immediate issues but also play a critical role in advancing product design, materials selection, and manufacturing processes. By identifying weaknesses early in the product lifecycle, companies can enhance quality control, improve product performance, and reduce costly recalls or repairs, making failure analysis an indispensable tool in modern engineering.

Why Is Failure Analysis Critical for Improving Product Reliability and Preventing Catastrophic Failures?

Failure analysis is critical for improving product reliability and preventing catastrophic failures because it provides a systematic approach to understanding the root causes of failures, allowing engineers to develop more durable and reliable designs. In industries where safety is paramount-such as aerospace, automotive, and nuclear energy-a single failure can lead to significant financial loss, environmental damage, or even loss of life. Failure analysis helps engineers pinpoint the exact failure mode, whether it's fatigue, corrosion, thermal degradation, or stress fracture, and offers solutions to prevent similar incidents in the future. By examining factors such as material defects, design flaws, improper usage, or manufacturing inconsistencies, failure analysis helps prevent recurring problems, ensuring the long-term performance and safety of products.

Furthermore, failure analysis improves product reliability by enabling manufacturers to refine their materials and processes. For example, in electronics manufacturing, failure analysis can reveal why certain components fail due to thermal stress, electrical overload, or improper soldering techniques. By identifying these issues, manufacturers can adjust design parameters, select more suitable materials, or improve assembly processes to enhance the reliability of their products. In this way, failure analysis is a proactive strategy that helps companies avoid costly product recalls, reduce warranty claims, and build consumer trust by consistently delivering high-quality, dependable products. It also plays a crucial role in risk management by helping industries comply with regulatory standards and safety certifications, minimizing the likelihood of unforeseen accidents or failures.

What Are the Expanding Applications and Innovations in Failure Analysis Across Industries?

The applications of failure analysis are expanding across a wide range of industries as advancements in technology and materials science continue to develop. In the aerospace and defense sectors, failure analysis is used extensively to investigate the failure of critical components such as engines, landing gear, and avionics systems. Aircraft parts are subjected to extreme conditions, and even the smallest failure can result in significant safety risks. Failure analysis in aerospace often involves methods such as fractography, metallurgy, and non-destructive testing (NDT) to detect fractures, fatigue, or corrosion that may compromise a component’s integrity. Additionally, failure analysis plays a key role in understanding material fatigue in spacecraft components, contributing to the development of safer and more reliable space exploration technologies.

In the automotive industry, failure analysis is critical for ensuring the safety and durability of vehicles, especially as electric vehicles (EVs) and autonomous driving technologies become more prevalent. Engineers use failure analysis to investigate issues related to battery degradation, motor failures, or sensor malfunctions. As EV batteries are subjected to thermal cycling and repeated charge-discharge cycles, failure analysis can help identify the causes of battery degradation and suggest improvements in materials or cooling systems to extend battery life. Moreover, with the rise of autonomous driving technologies, failure analysis is increasingly used to ensure that sensors, processors, and other electronics function reliably in real-world conditions, helping to enhance vehicle safety and performance.

Innovations in failure analysis are driving the development of more sophisticated tools and techniques for examining and predicting failures. For example, advancements in scanning electron microscopy (SEM) and transmission electron microscopy (TEM) allow engineers to analyze materials at the atomic level, identifying defects or microstructural changes that may have contributed to failure. This level of precision is particularly important in industries such as semiconductors and nanotechnology, where even microscopic defects can lead to significant product failures. Additionally, artificial intelligence (AI) and machine learning are being integrated into failure analysis processes, enabling the rapid identification of failure patterns in large datasets. AI algorithms can detect subtle correlations between different variables, such as temperature, stress, and material properties, providing deeper insights into the causes of failure and enabling more accurate failure prediction.

In the energy sector, failure analysis is crucial for maintaining the safety and reliability of power generation equipment, such as turbines, generators, and transmission lines. As the global demand for energy continues to grow, and renewable energy systems such as wind turbines and solar panels become more widespread, failure analysis helps identify the root causes of mechanical wear, corrosion, and electrical failures in these systems. For example, in wind turbines, failure analysis is used to understand blade fatigue, gearbox malfunctions, and generator breakdowns, helping operators extend the lifespan of equipment and improve overall energy efficiency. With the increasing reliance on sustainable energy, the role of failure analysis in ensuring the long-term reliability of renewable energy infrastructure is becoming more important than ever.

What Factors Are Driving the Growth of the Failure Analysis Market?

The growth of the failure analysis market is driven by several key factors, including the increasing complexity of modern technologies, rising demand for product reliability and safety, and advancements in analytical tools and techniques. One of the primary drivers is the growing complexity of products and systems in industries such as electronics, aerospace, automotive, and energy. As devices become more sophisticated-incorporating advanced materials, miniaturized components, and intricate designs-the likelihood of failures due to design flaws, material defects, or manufacturing errors increases. Failure analysis is essential for diagnosing these issues, helping manufacturers maintain product quality and reliability in an increasingly competitive market.

Another significant factor driving the growth of the failure analysis market is the rising emphasis on safety, particularly in regulated industries such as aerospace, healthcare, and automotive. Governments and regulatory bodies worldwide have established stringent safety standards and certifications that companies must meet to ensure their products and processes are safe and reliable. Failure analysis helps companies comply with these standards by identifying potential safety hazards and preventing failures that could lead to accidents, product recalls, or regulatory penalties. The automotive industry, for example, must meet strict safety standards for critical components like brakes, airbags, and batteries, and failure analysis is a key tool for verifying that these components function correctly under real-world conditions.

The increasing demand for reliability in high-tech industries, such as semiconductor manufacturing, telecommunications, and renewable energy, is another factor driving the growth of failure analysis. As the global economy becomes more reliant on advanced technology, companies cannot afford system failures that could disrupt operations or cause financial losses. Failure analysis plays a vital role in the semiconductor industry, where tiny defects in integrated circuits can lead to significant performance issues. Additionally, with the expansion of 5G networks and the Internet of Things (IoT), ensuring the reliability of electronic components and systems is more critical than ever. Failure analysis helps manufacturers detect potential vulnerabilities early in the production process, ensuring that products meet the rigorous performance requirements demanded by these high-tech sectors.

Advancements in analytical tools and techniques, including non-destructive testing (NDT), scanning electron microscopy (SEM), and X-ray tomography, are further fueling the growth of the failure analysis market. These tools allow engineers to examine materials and components with unprecedented precision, helping to identify defects, fractures, and other signs of wear or damage that may not be visible to the naked eye. The integration of artificial intelligence (AI) and machine learning into failure analysis processes is also enhancing the ability to predict failures and optimize maintenance schedules, further driving the adoption of failure analysis in industries that require high reliability and performance.

In conclusion, the failure analysis market is poised for significant growth as industries continue to demand higher levels of product reliability, safety, and performance. As technology becomes more complex and the need for failure prevention becomes more critical, failure analysis will play an increasingly central role in ensuring the long-term success of products and systems across industries. With ongoing advancements in analytical techniques and the integration of AI, failure analysis will continue to evolve, providing companies with powerful tools to enhance quality control, improve safety, and optimize product development.

SCOPE OF STUDY:

The report analyzes the Failure Analysis market in terms of units by the following Segments, and Geographic Regions/Countries:

Segments:

Equipment (Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM), Other Equipment); Application (Electronics & Semiconductor, Material Science, Industrial Science, Bio-Science)

Geographic Regions/Countries:

World; United States; Canada; Japan; China; Europe (France; Germany; Italy; United Kingdom; and Rest of Europe); Asia-Pacific; Rest of World.

Select Competitors (Total 47 Featured) -

  • A&D Company Ltd.
  • Carl Zeiss Smt GmbH
  • FEI Company
  • Hitachi High-Technologies Corporation
  • Intertek Group PLC
  • JEOL Ltd.
  • Motion X Corporation
  • Tescan Orsay Holding, a. s.
  • Thermo Fisher Scientific, Inc.

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TARIFF IMPACT FACTOR

Our new release incorporates impact of tariffs on geographical markets as we predict a shift in competitiveness of companies based on HQ country, manufacturing base, exports and imports (finished goods and OEM). This intricate and multifaceted market reality will impact competitors by increasing the Cost of Goods Sold (COGS), reducing profitability, reconfiguring supply chains, amongst other micro and macro market dynamics.

TABLE OF CONTENTS

I. METHODOLOGY

II. EXECUTIVE SUMMARY

  • 1. MARKET OVERVIEW
    • Trade Shocks, Uncertainty, and the Structural Rewiring of the Global Economy
    • How Trump's Tariffs Impact the Market? The Big Question on Everyone's Mind
    • Failure Analysis - Global Key Competitors Percentage Market Share in 2025 (E)
    • Competitive Market Presence - Strong/Active/Niche/Trivial for Players Worldwide in 2025 (E)
  • 2. FOCUS ON SELECT PLAYERS
  • 3. MARKET TRENDS & DRIVERS
    • Increasing Complexity of Material and Component Designs Driving Demand for Failure Analysis
    • Advancements in Microscopy and Spectroscopy Enhancing Failure Analysis Capabilities
    • Growing Need for Quality Assurance and Control in Manufacturing Boosting Failure Analysis Services
    • Market Trends Toward Predictive Maintenance and Proactive Failure Prevention
    • Impact of Industry 4.0 on the Evolution of Failure Analysis Techniques
    • Future Directions: AI and Machine Learning in Automating Failure Analysis Processes
    • Technological Innovations in Non-destructive Testing (NDT) Methods
  • 4. GLOBAL MARKET PERSPECTIVE
    • TABLE 1: World Recent Past, Current & Future Analysis for Electronics & Semiconductor by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 2: World Historic Review for Electronics & Semiconductor by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 3: World 15-Year Perspective for Electronics & Semiconductor by Geographic Region - Percentage Breakdown of Value Sales for USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World for Years 2015, 2025 & 2030
    • TABLE 4: World Recent Past, Current & Future Analysis for Material Science by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 5: World Historic Review for Material Science by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 6: World 15-Year Perspective for Material Science by Geographic Region - Percentage Breakdown of Value Sales for USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World for Years 2015, 2025 & 2030
    • TABLE 7: World Recent Past, Current & Future Analysis for Industrial Science by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 8: World Historic Review for Industrial Science by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 9: World 15-Year Perspective for Industrial Science by Geographic Region - Percentage Breakdown of Value Sales for USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World for Years 2015, 2025 & 2030
    • TABLE 10: World Recent Past, Current & Future Analysis for Bio-Science by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 11: World Historic Review for Bio-Science by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 12: World 15-Year Perspective for Bio-Science by Geographic Region - Percentage Breakdown of Value Sales for USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World for Years 2015, 2025 & 2030
    • TABLE 13: World Recent Past, Current & Future Analysis for Scanning Electron Microscope (SEM) by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 14: World Historic Review for Scanning Electron Microscope (SEM) by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 15: World 15-Year Perspective for Scanning Electron Microscope (SEM) by Geographic Region - Percentage Breakdown of Value Sales for USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World for Years 2015, 2025 & 2030
    • TABLE 16: World Recent Past, Current & Future Analysis for Focused Ion Beam System (FIB) by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 17: World Historic Review for Focused Ion Beam System (FIB) by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 18: World 15-Year Perspective for Focused Ion Beam System (FIB) by Geographic Region - Percentage Breakdown of Value Sales for USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World for Years 2015, 2025 & 2030
    • TABLE 19: World Recent Past, Current & Future Analysis for Dual-Beam System (FIB-SEM) by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 20: World Historic Review for Dual-Beam System (FIB-SEM) by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 21: World 15-Year Perspective for Dual-Beam System (FIB-SEM) by Geographic Region - Percentage Breakdown of Value Sales for USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World for Years 2015, 2025 & 2030
    • TABLE 22: World Recent Past, Current & Future Analysis for Transmission Electron Microscope (TEM) by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 23: World Historic Review for Transmission Electron Microscope (TEM) by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 24: World 15-Year Perspective for Transmission Electron Microscope (TEM) by Geographic Region - Percentage Breakdown of Value Sales for USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World for Years 2015, 2025 & 2030
    • TABLE 25: World Recent Past, Current & Future Analysis for Other Equipment by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 26: World Historic Review for Other Equipment by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 27: World 15-Year Perspective for Other Equipment by Geographic Region - Percentage Breakdown of Value Sales for USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World for Years 2015, 2025 & 2030
    • TABLE 28: World Failure Analysis Market Analysis of Annual Sales in US$ Million for Years 2015 through 2030
    • TABLE 29: World Recent Past, Current & Future Analysis for Failure Analysis by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 30: World Historic Review for Failure Analysis by Geographic Region - USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 31: World 15-Year Perspective for Failure Analysis by Geographic Region - Percentage Breakdown of Value Sales for USA, Canada, Japan, China, Europe, Asia-Pacific and Rest of World Markets for Years 2015, 2025 & 2030

III. MARKET ANALYSIS

  • UNITED STATES
    • Failure Analysis Market Presence - Strong/Active/Niche/Trivial - Key Competitors in the United States for 2025 (E)
    • TABLE 32: USA Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 33: USA Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 34: USA 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 35: USA Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 36: USA Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 37: USA 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
  • CANADA
    • TABLE 38: Canada Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 39: Canada Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 40: Canada 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 41: Canada Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 42: Canada Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 43: Canada 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
  • JAPAN
    • Failure Analysis Market Presence - Strong/Active/Niche/Trivial - Key Competitors in Japan for 2025 (E)
    • TABLE 44: Japan Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 45: Japan Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 46: Japan 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 47: Japan Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 48: Japan Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 49: Japan 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
  • CHINA
    • Failure Analysis Market Presence - Strong/Active/Niche/Trivial - Key Competitors in China for 2025 (E)
    • TABLE 50: China Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 51: China Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 52: China 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 53: China Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 54: China Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 55: China 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
  • EUROPE
    • Failure Analysis Market Presence - Strong/Active/Niche/Trivial - Key Competitors in Europe for 2025 (E)
    • TABLE 56: Europe Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 57: Europe Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 58: Europe 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 59: Europe Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 60: Europe Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 61: Europe 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
    • TABLE 62: Europe Recent Past, Current & Future Analysis for Failure Analysis by Geographic Region - France, Germany, Italy, UK and Rest of Europe Markets - Independent Analysis of Annual Sales in US$ Million for Years 2024 through 2030 and % CAGR
    • TABLE 63: Europe Historic Review for Failure Analysis by Geographic Region - France, Germany, Italy, UK and Rest of Europe Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 64: Europe 15-Year Perspective for Failure Analysis by Geographic Region - Percentage Breakdown of Value Sales for France, Germany, Italy, UK and Rest of Europe Markets for Years 2015, 2025 & 2030
  • FRANCE
    • Failure Analysis Market Presence - Strong/Active/Niche/Trivial - Key Competitors in France for 2025 (E)
    • TABLE 65: France Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 66: France Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 67: France 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 68: France Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 69: France Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 70: France 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
  • GERMANY
    • Failure Analysis Market Presence - Strong/Active/Niche/Trivial - Key Competitors in Germany for 2025 (E)
    • TABLE 71: Germany Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 72: Germany Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 73: Germany 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 74: Germany Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 75: Germany Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 76: Germany 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
  • ITALY
    • TABLE 77: Italy Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 78: Italy Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 79: Italy 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 80: Italy Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 81: Italy Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 82: Italy 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
  • UNITED KINGDOM
    • Failure Analysis Market Presence - Strong/Active/Niche/Trivial - Key Competitors in the United Kingdom for 2025 (E)
    • TABLE 83: UK Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 84: UK Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 85: UK 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 86: UK Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 87: UK Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 88: UK 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
  • REST OF EUROPE
    • TABLE 89: Rest of Europe Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 90: Rest of Europe Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 91: Rest of Europe 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 92: Rest of Europe Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 93: Rest of Europe Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 94: Rest of Europe 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
  • ASIA-PACIFIC
    • Failure Analysis Market Presence - Strong/Active/Niche/Trivial - Key Competitors in Asia-Pacific for 2025 (E)
    • TABLE 95: Asia-Pacific Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 96: Asia-Pacific Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 97: Asia-Pacific 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 98: Asia-Pacific Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 99: Asia-Pacific Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 100: Asia-Pacific 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030
  • REST OF WORLD
    • TABLE 101: Rest of World Recent Past, Current & Future Analysis for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 102: Rest of World Historic Review for Failure Analysis by Application - Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 103: Rest of World 15-Year Perspective for Failure Analysis by Application - Percentage Breakdown of Value Sales for Electronics & Semiconductor, Material Science, Industrial Science and Bio-Science for the Years 2015, 2025 & 2030
    • TABLE 104: Rest of World Recent Past, Current & Future Analysis for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment - Independent Analysis of Annual Sales in US$ Million for the Years 2024 through 2030 and % CAGR
    • TABLE 105: Rest of World Historic Review for Failure Analysis by Equipment - Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment Markets - Independent Analysis of Annual Sales in US$ Million for Years 2015 through 2023 and % CAGR
    • TABLE 106: Rest of World 15-Year Perspective for Failure Analysis by Equipment - Percentage Breakdown of Value Sales for Scanning Electron Microscope (SEM), Focused Ion Beam System (FIB), Dual-Beam System (FIB-SEM), Transmission Electron Microscope (TEM) and Other Equipment for the Years 2015, 2025 & 2030

IV. COMPETITION